CY7C1051H30-10BVXIT
现货,推荐
符合RoHS标准
无铅

CY7C1051H30-10BVXIT

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CY7C1051H30-10BVXIT
CY7C1051H30-10BVXIT


商品详情

  • 实时时钟
    N
  • 密度
    8 MBit
  • 峰值回流温度
    260 °C
  • 工作温度 范围
    -40 °C 至 85 °C
  • 工作电压 (VCCQ) 范围
    2.2 V 至 3.6 V
  • 工作电压 范围
    2.2 V 至 3.6 V
  • 引线球表面
    Sn/Ag/Cu
  • 接口
    Parallel
  • 目前计划的可用性至少到
    2033
  • 看门狗定时器
    N
  • 系列
    FAST SRAM
  • 组织(X x Y)
    512K x 16
  • 警报
    N
  • 质量等级
    Industrial
  • 速度
    10 ns

OPN
CY7C1051H30-10BVXIT
产品状态 active and preferred
英飞凌封装名称
封装名 VFBGA-48 (51-85150)
封装尺寸 2000
封装类型 TAPE & REEL
湿度 3
防潮封装 DRY
无铅 Yes
无卤素 Yes
符合RoHS标准 Yes
预估长期供货截止日期 2033
产品发布日期 03/2022
封装产地
TH
晶圆产地
TW

产品状态
Active
英飞凌封装名称
封装名 VFBGA-48 (51-85150)
封装尺寸 2000
封装类型 TAPE & REEL
湿度 3
防潮封装 DRY
无铅
无卤素
符合 RoHS 标准
预估长期供货截止日期 2033
产品发布日期 03/2022
封装产地
TH
晶圆产地
TW
CY7C1051H30-10BVXIT is an 8-Mbit (512K × 16) asynchronous CMOS SRAM with embedded ECC for single-bit error correction (no automatic write-back). It operates from 2.2 V to 3.6 V over −40°C to +85°C and provides 10 ns access time. It uses a single CE and supports byte reads/writes via BLE/BHE with OE and WE controls. Typical ICC is 90 mA at 100 MHz, and CMOS standby (ISB2) is 20 mA (typ).

特性

  • 8-Mbit (512K x16) SRAM array
  • Embedded ECC single-bit correction
  • 10 ns address access (tAA)
  • 10 ns read/write cycle (tRC/tWC)
  • 2.2 V to 3.6 V VCC operation
  • 90 mA typ ICC at 100 MHz
  • 20 mA typ ISB2 standby current
  • 1.0 V data retention mode
  • TTL-compatible I/O levels
  • Byte write enables (BHE, BLE)
  • Outputs go high-Z when deselected
  • Ambient temp -40°C to +85°C

产品优势

  • Fits 16-bit buses, less glue logic
  • ECC corrects single-bit data errors
  • 10 ns access cuts CPU wait states
  • 10 ns cycles support fast SRAM ops
  • 2.2–3.6 V works with mixed rails
  • 90 mA typ reduces active power
  • Standby current cuts idle power
  • 1.0 V retention saves backup power
  • TTL levels ease legacy interfacing
  • Byte writes reduce write bandwidth
  • High-Z outputs simplify bus sharing
  • -40°C to +85°C boosts reliability

应用

文档

设计资源

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