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Repetitive short circuit behaviour of Trench-/Field-Stop IGBTs

This paper has a focus on the short circuit robustness of eupec modules with 1200V 3rd generation IGBT chip from Infineon. Short-circuit failure modes are described and measures with regard to an optimized and robust chip structure are presented. Measurements of repetitive short-circuit pulses based on the Trench/Field-Stop IGBT 3 show that the typical number of short circuit pulses until destruction depends exponentially on the maximum chip temperature reached within the pulse. For traditional 600V, 1200V and 1700V applications in the industrial drives segment an essential demand for short circuit capability of IGBTs exists. Among others this is one reason why the robust “Non Punch Through” IGBT technology with homogeneous base material dominated the original “Punch Through” concept based on Epitaxial technology. In the last two years a tendency towards a new vertical structure called “Field Stop” IGBT can be observed, which is also known as “Soft Punch Through” or “Light Punch Through”.

• 203.34 KB
• 07/02/2014